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 HOME >Tool's Information |
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Tool's Specification.
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Tool Name
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SONIX Quantum 350 Scanning Acoustic Microscopy (SAM) |
| Model |
Quantum 350 |
Maker |
SONIX |
| Wafer Size |
8"
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Vintage |
2006- |
| Sell Status |
SELL
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Tool's Condition |
Operational
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| Description |
Scanning Acoustic Tomography (SAT), also called Scanning Acoustic Microscope (SAM), is a method for analyzing materials by measuring the reflecting speed and energy of an ultrasonic wave which is transmitted through the material of a certain thickness.
Testing modes:
A-scan (ultrasonic signal).
B-scan (2D reflective cross-section detection/ imaging).
C-scan (2D reflective plane detection/ imaging).
Through-scan (pass-through detection/ imaging).
Applications / Features:
Normally used to detect delaminations or cracks inside the package, SAT is capable of detecting micro gaps down to 0.13¥ìm.
IC package level structure analysis
IC package quality on PCBA level
PCB/IC substrate structure analysis
Wafer level structure analysis
WLCSP structure analysis
CMOS structure analysis
Imaging resolution : 0.5 micron
Scan speed : Max. 1000 mm/s
Scan area : 350 mm x 350 mm
** Operational, but transducer & adotor cable missing
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- Address:
3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
- Phone:
82-41-554-6920~1 FAX: 82-41-554-6922
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