Metrology
 
 HOME >设备信息
设备信息
设备名称 N&K OptiPrime - CD
型号 OptiPrime - CD 制造商 N&K
晶元尺寸 8" Vintage -
销售状态 销售中 设备状态 Refurbishing
数据 Key Qualities of OptiPrime - CD

•; Optimized Polarized Reflectance (Rs and Rp) Data
- Wavelength Range: 190 - 1000 nm
- Micro-Spot Technology
•; Can be Configured for 300 mm (12”), 200 mm (8”),and 150 mm (6”) Wafers
•; Fully Automated
•; Based on Patented Reflective Optics that Optimizes the Signal-to-Noise Ratio
•; Strong Sensitivity to Sub-Nanometer Structural and Material Variations
- Thickness, n and k (from 190 –; 1000 nm)
•; OCD Metrology for 2-D and 3 -D Structures
(Trenches and Contact Holes)
- Depth, CD, Profile
•; Cognex Pattern Recognition Software
•; No Re-Alignment Issues Upon Light Bulb Replacement
•; Modular design –; Easy to Maintain and Service
•; GEM/SECS Communication Interface
•; SEMI Standard and Third Party Certifications

.Dimensions (W x D x H): 112 cm x 202 cm x 189 츠
.Weight (unpacked): 770 Kg
.Facility Requirements:
100 - 240 V, 50/60 Hz, 1Φ
Vacuum, CDA (for FOUP Load Port)
     
  - 总公司: 3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
  - 电话: 82-41-554-6920~1 传真: 82-41-554-6922