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 HOME >设备信息 |
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设备信息
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设备名称
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*Thermawave OP2600 |
| 型号 |
OP2600 |
制造商 |
THERMAWAVE |
| 晶元尺寸 |
8"
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Vintage |
1994-12 |
| 销售状态 |
销售完毕
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设备状态 |
Refurbished
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| 数据 |
The Therma-Wave Opti-Probe 2600 and 2690 are used for measurement of a wide range of optical parameters such as film thickness of multiple layers and index of refraction. Compatible with wafers ranging from 4- to 8-inches, the system has two cassette loader stations. The Opti-Probe supports Beam Profile Reflectrometry (BPR) and Beam Profile Ellipsometry (BPE) modes. A 675 nm thermoelectrically cooled diode laser is used to establish the optical parameter and in spectrometry mode a visible 450 to 840 nm tungsten halogen lamp it used.
Supports the full range of thick and thin film, refractive indexes, extinction coefficient and reflectivity measurements
Multi-layer and multi-parameter measurements on thin ONO and OPO film stacks
Small micro-ellipsometer spot size (0.9 micron) eliminates under- and over-polishing
Enables control of polish rate and detection of polish slopes on areas as small as 7 micron x 7 micron
Spectrometer light source is can be changed in 15 minutes without any optics recalibration
Long-life light sources eliminate frequent changes and requalification
BPR (Beam Profile Reflectometry : thick dielectric films > 500A)
BPE (Beam Profile Ellipsometry : thin dielectric films < 500A)
Spectrometry (High Index films : C-Si, Poly-Si, A-Si)
*. Installed in Clean-room. |
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- 总公司:
3, Tongjeong 3-ro, Dongnam-gu, Cheonan-si, Chungcheongnam-do, Korea ,31208
- 电话:
82-41-554-6920~1 传真: 82-41-554-6922
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